¾È³çÇϽʴϱî. (ÁÖ)µðÀ£ÀüÀÚ ÀÔ´Ï´Ù.
SN8F27E65 TestBoard »ç¿ëÀÚ ¼³¸í¼ÀÔ´Ï´Ù.
óÀ½ º¸µå »ç¿ëÇÏ½Ç ¶§ Âü°íÇÏ½Ã±æ ¹Ù¶ø´Ï´Ù.
°¨»çÇÕ´Ï´Ù.
Memory configuration
Flash ROM size: 6K x 16 bits. Including EEROM emulation. (In system programming)
RAM size: 512 x 8 bits.
I/O pin configuration
Bi-directional: P0, P1, P4, P5.
Wakeup: P0, P1 level change.
Pull-up resisters: P0, P1, P4, P5.
External interrupt: P0.0, P0.1
ADC input pin: AIN0~AIN11.
Operating Voltage : 1.8V ~ 5.5V
12- channel 10-bit SAR ADC.
Serial Interface: SIO, UART, MSP
13 interrupt sources
11 internal interrupts: T0, TC0, TC1, TC2, T1, ADC,SIO, MSP, UTX(UART TX), URX(UART RX), WAKE
2 external interrupts: INT0, INT1
Four 8-bit timer. (T0, TC0, TC1, TC2).
One 16-bit timer (T1) with capture timer function
Four system clocks
External high clock: RC type up to 10MHz
External high clock: Crystal type up to 16MHz
Internal high clock: RC type 16MHz
Internal low clock: RC type 16KHz